Speaker
Hiroyuki Aoki
Description
Neutron reflectometry (NR) has been employed to analyze the nanometric structure of the surface and interfaces of various materials. In a conventional NR experiment, the illuminated area is on the order of 1 - 10 cm^2; therefore, it has been difficult to use the NR for the sample with in-plane inhomogeneity. This work realized a spatially resolved NR technique by the combination of a "sheet-shaped" neutron beam with a two-dimensional detector and the computed tomography. The depth profile of the neutron scattering length density was analyzed at a local area smaller than 1 mm^2. The current NR tomography method would enable NR measurements for an interface with an inhomogeneous structure.
