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7:00 PM
Introduction
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Thomas Arnold
(European Spallation Source ERIC)
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7:15 PM
Reinventing time-of-flight reflectometry—return of a proven approach
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Tim Charlton
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7:45 PM
Free Thiols Regulatation of the Interactions and Self-Assembly of Thiol-Passivated Metal Nanoparticles investigated with X-ray scattering and MD simulations.
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Binhua Lin
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8:30 PM
Why NeXus?
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Ray Osborn
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9:00 PM
35 years of x-ray reflectivity at NSLS & NSLS II: science hiding in small features and the new kid (instrument) on the block
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Ben Ocko
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9:30 PM
The Data Analysis Working Group
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Brian Maranville
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9:45 PM
The Reproducibility Working Group
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Andrew McCluskey
(European Spallation Source ERIC)