Speaker
Dr
Wolfgang Kreuzpaintner
(Technische Universität München)
Description
Thin magnetic layers and heterostructures are the basic building blocks of a large number of magneto-electronic devices.
While the structural characterisation of thin films during growth by various techniques is common practice (as e.g. commonly done by RHEED/LEED, STM or synchrotron radiation), the in-situ measurement of the magnetic properties of films using (polarised) neutron reflectometry is a challenging task. Within a collaboration of TU München, University Augsburg and MPI Stuttgart, we operate a mobile sputtering facility for the growth and in-situ monitoring of magnetic multilayers, which can be installed at suitable neutron beamlines. In our contribution, the setup and first proof of principle polarised in-situ neutron reflectivity measurements on in-situ grown Fe/Cr carried out at the ToF reflectometer REFSANS at the FRM II neutron source and at the AMOR beamline at PSI will be presented. At the latter, use of the Selene neutron optical concept allows very fast polarised neutron reflectivity measurements to be performed within only 15min per spin direction.
Primary author
Dr
Wolfgang Kreuzpaintner
(Technische Universität München)
