Speaker
Description
This presentation will give an overview of wavelength resolved imaging methods and instru-mentation developed and pursued at the instruments of the Applied Materials Group at PSI. It will focus on such methods, techniques, applications and results not covered in other con-tributions. Recently added capabilities from a new velocity selector, and new double crystal monochromator at ICON as well as the addition of a chopper system for our pioneering ap-proaches for time-of-flight imaging at a continuous source will be discussed. New contrast modalities such as inelastic scattering contrast, polarized dark-field imaging as well as multi-directional dark-field contrast will be presented together with outstanding applications in material science[1].
| Abstract Topic | Development of experimental techniques and new principles |
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